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Single-electron devices formed by pattern-dependent oxidation: microscopic structural evaluation
Single-electron devices formed by pattern-dependent oxidation: microscopic structural evaluation
Single-electron devices formed by pattern-dependent oxidation: microscopic structural evaluation
Nagase, M. (Autor:in) / Horiguchi, S. (Autor:in) / Fujiwara, A. (Autor:in) / Ono, Y. (Autor:in) / Yamazaki, K. (Autor:in) / Namatsu, H. (Autor:in) / Takahashi, Y. (Autor:in)
APPLIED SURFACE SCIENCE ; 190 ; 144-150
01.01.2002
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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