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Single-electron devices formed by pattern-dependent oxidation: microscopic structural evaluation

Nagase, M. / Horiguchi, S. / Fujiwara, A. / Ono, Y. / Yamazaki, K. / Namatsu, H. / Takahashi, Y.

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Single-electron devices formed by pattern-dependent oxidation: microscopic structural evaluation

Nagase, M. / Horiguchi, S. / Fujiwara, A. / Ono, Y. / Yamazaki, K. / Namatsu, H. / Takahashi, Y.

Single-electron devices formed by pattern-dependent oxidation: microscopic structural evaluation

Nagase, M. / Horiguchi, S. / Fujiwara, A. / Ono, Y. / Yamazaki, K. / Namatsu, H. / Takahashi, Y.

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Check availability in my library

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Document information

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Document information

Title:

Single-electron devices formed by pattern-dependent oxidation: microscopic structural evaluation

Contributors:

Nagase, M. (author) / Horiguchi, S. (author) / Fujiwara, A. (author) / Ono, Y. (author) / Yamazaki, K. (author) / Namatsu, H. (author) / Takahashi, Y. (author)

Published in:

APPLIED SURFACE SCIENCE ; 190 ; 144-150

Publication date:

2002-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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