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Scanned-probe topological and spectroscopic study of surface states on clean and Si-deposited GaAs (001)-c(4x4) surfaces
Scanned-probe topological and spectroscopic study of surface states on clean and Si-deposited GaAs (001)-c(4x4) surfaces
Scanned-probe topological and spectroscopic study of surface states on clean and Si-deposited GaAs (001)-c(4x4) surfaces
Negoro, N. (Autor:in) / Kasai, S. (Autor:in) / Hasegawa, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 190 ; 269-274
01.01.2002
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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