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Depth-resolved cathodoluminescence characterization of buried InGaP/GaAs heterointerfaces
Depth-resolved cathodoluminescence characterization of buried InGaP/GaAs heterointerfaces
Depth-resolved cathodoluminescence characterization of buried InGaP/GaAs heterointerfaces
Ishikawa, F. (Autor:in) / Hasegawa, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 190 ; 508-512
01.01.2002
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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