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Atomic resolution imaging of Si(1 0 0)1x1:2H dihydride surface with noncontact atomic force microscopy (NC-AFM)
Atomic resolution imaging of Si(1 0 0)1x1:2H dihydride surface with noncontact atomic force microscopy (NC-AFM)
Atomic resolution imaging of Si(1 0 0)1x1:2H dihydride surface with noncontact atomic force microscopy (NC-AFM)
Araragi, S. (Autor:in) / Yoshimoto, A. (Autor:in) / Nakata, N. (Autor:in) / Sugawara, Y. (Autor:in) / Morita, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 188 ; 272-278
01.01.2002
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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