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Potential profile around step edges of Si surface measured by nc-AFM
Potential profile around step edges of Si surface measured by nc-AFM
Potential profile around step edges of Si surface measured by nc-AFM
Hasegawa, Y. (Autor:in) / Eguchi, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 188 ; 386-390
01.01.2002
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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Reconstruction, step edges and self-organization on the Au(111) surface
British Library Online Contents | 2000
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