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Potential profile around step edges of Si surface measured by nc-AFM
Potential profile around step edges of Si surface measured by nc-AFM
Potential profile around step edges of Si surface measured by nc-AFM
Hasegawa, Y. (author) / Eguchi, T. (author)
APPLIED SURFACE SCIENCE ; 188 ; 386-390
2002-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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Reconstruction, step edges and self-organization on the Au(111) surface
British Library Online Contents | 2000
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