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Novel Methods to Measure Residual Stresses in Thin Films
Novel Methods to Measure Residual Stresses in Thin Films
Novel Methods to Measure Residual Stresses in Thin Films
Zhang, T.-Y. (Autor:in)
KEY ENGINEERING MATERIALS ; 31-40
01.01.2002
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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