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Improved defect profiling with slow positrons
Improved defect profiling with slow positrons
Improved defect profiling with slow positrons
Krause-Rehberg, R. (Autor:in) / Borner, F. (Autor:in) / Redmann, F. (Autor:in) / Egger, W. (Autor:in) / Kogel, G. (Autor:in) / Sperr, P. (Autor:in) / Triftshauser, W. (Autor:in)
APPLIED SURFACE SCIENCE ; 194 ; 210-213
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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