Thermal Evolution of Defects in H-Implanted Silicon Investigated by Slow Positrons

Brusa, R. S. / Zecca, A. / Meng, X. T. et al. | British Library Online Contents | 1995

Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon

Van der Werf, D. P. / Saleh, A. S. / Towner, A. et al. | British Library Online Contents | 1997

Improved defect profiling with slow positrons

Krause-Rehberg, R. / Borner, F. / Redmann, F. et al. | British Library Online Contents | 2002

Characterization of vacancy-like defects in boron-implanted silicon with slow positrons

Gebauer, J. / Eichler, S. / Krause-Rehberg, R. et al. | British Library Online Contents | 1997

Characterization of H-related defects in H-implanted Si with slow positrons

Fujinami, M. / Suzuki, R. / Ohdaira, T. et al. | British Library Online Contents | 1999