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X-ray diffraction topography investigation of the core in Bi12SiO20 crystals
X-ray diffraction topography investigation of the core in Bi12SiO20 crystals
X-ray diffraction topography investigation of the core in Bi12SiO20 crystals
Milenov, T. I. (Autor:in) / Rafailov, P. M. (Autor:in) / Botev, P. A. (Autor:in) / Gospodinov, M. M. (Autor:in)
MATERIALS RESEARCH BULLETIN ; 37 ; 1651-1658
01.01.2002
8 pages
Aufsatz (Zeitschrift)
Englisch
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