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ToF-SIMS characterization of molecular ions from Fomblin Z-DOL on Ag substrates
ToF-SIMS characterization of molecular ions from Fomblin Z-DOL on Ag substrates
ToF-SIMS characterization of molecular ions from Fomblin Z-DOL on Ag substrates
Abe, Y. (Autor:in) / Okuhira, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 203-204 ; 175-179
01.01.2003
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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