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Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors
Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors
Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors
Chu, M. W. (Autor:in) / Ganne, M. (Autor:in) / Tessier, P. Y. (Autor:in) / Eon, D. (Autor:in) / Caldes, M. T. (Autor:in) / Brohan, L. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 5 ; 179-182
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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