A platform for research: civil engineering, architecture and urbanism
Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors
Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors
Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors
Chu, M. W. (author) / Ganne, M. (author) / Tessier, P. Y. (author) / Eon, D. (author) / Caldes, M. T. (author) / Brohan, L. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 5 ; 179-182
2002-01-01
4 pages
Article (Journal)
English
DDC:
621.38152
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Properties of tungsten-doped Bi4Ti3O12-SrBi4Ti4O15 intergrowth ferroelectrics
British Library Online Contents | 2007
|Impact of Pt bottom electrode on the properties of ferroelectric Bi3.25La0.75Ti3O12 capacitors
British Library Online Contents | 2007
|Polarization comparison of Pb(Zr,Ti)O3 and Bi4Ti3O12-based ferroelectrics
British Library Online Contents | 2005
|British Library Online Contents | 2008
|British Library Online Contents | 2007
|