Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis-importance of epoxy impregnation
Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis-importance of epoxy impregnation
Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis-importance of epoxy impregnation
Kjellsen, K. O. (Autor:in) / Monsoy, A. (Autor:in) / Isachsen, K. (Autor:in) / Detwiler, R. J. (Autor:in)
CEMENT AND CONCRETE RESEARCH ; 33 ; 611-616
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.135
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