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Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis-importance of epoxy impregnation
Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis-importance of epoxy impregnation
Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis-importance of epoxy impregnation
Kjellsen, K. O. (author) / Monsoy, A. (author) / Isachsen, K. (author) / Detwiler, R. J. (author)
CEMENT AND CONCRETE RESEARCH ; 33 ; 611-616
2003-01-01
6 pages
Article (Journal)
English
DDC:
620.135
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