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Processing and microstructural characterization of sputter-deposited Ni/Ni~3Al multilayered thin films
Processing and microstructural characterization of sputter-deposited Ni/Ni~3Al multilayered thin films
Processing and microstructural characterization of sputter-deposited Ni/Ni~3Al multilayered thin films
Sperling, E. A. (Autor:in) / Banerjee, R. (Autor:in) / Thompson, G. B. (Autor:in) / Fain, J. P. (Autor:in) / Anderson, P. M. (Autor:in) / Fraser, H. L. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 18 ; 979-987
01.01.2003
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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