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    Processing and microstructural characterization of sputter-deposited Ni/Ni~3Al multilayered thin films

    New search for: Sperling, E. A.
    New search for: Banerjee, R.
    New search for: Thompson, G. B.
    New search for: Fain, J. P.
    New search for: Anderson, P. M.
    New search for: Fraser, H. L.

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    Processing and microstructural characterization of sputter-deposited Ni/Ni~3Al multilayered thin films

    New search for: Sperling, E. A.
    New search for: Banerjee, R.
    New search for: Thompson, G. B.
    New search for: Fain, J. P.
    New search for: Anderson, P. M.
    New search for: Fraser, H. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Processing and microstructural characterization of sputter-deposited Ni/Ni~3Al multilayered thin films

    New search for: Sperling, E. A.
    New search for: Banerjee, R.
    New search for: Thompson, G. B.
    New search for: Fain, J. P.
    New search for: Anderson, P. M.
    New search for: Fraser, H. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Processing and microstructural characterization of sputter-deposited Ni/Ni~3Al multilayered thin films

    Contributors:

    Sperling, E. A. (author) / Banerjee, R. (author) / Thompson, G. B. (author) / Fain, J. P. (author) / Anderson, P. M. (author) / Fraser, H. L. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 18 ; 979-987

    Publication date:

    2003-01-01

    Size:

    9 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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