Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Microstructure-controlled interdiffusion of Cu/Co/Au thin films investigated by three-dimensional atom probe
Microstructure-controlled interdiffusion of Cu/Co/Au thin films investigated by three-dimensional atom probe
Microstructure-controlled interdiffusion of Cu/Co/Au thin films investigated by three-dimensional atom probe
Lang, C. (Autor:in) / Schmitz, G. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 353 ; 119-125
01.01.2003
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography
British Library Online Contents | 2019
|Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography
British Library Online Contents | 2019
|Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography
British Library Online Contents | 2019
|British Library Online Contents | 2006
|Influence of the microstructure on the interreaction of Al/Ni investigated by tomographic atom probe
British Library Online Contents | 2002
|