Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements: Fid-Bau Portal

Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements

Tabuchi, M. / Kyouzu, H. / Takemi, M. / Takeda, Y.

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Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements

Tabuchi, M. / Kyouzu, H. / Takemi, M. / Takeda, Y.

Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements

Tabuchi, M. / Kyouzu, H. / Takemi, M. / Takeda, Y.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Ähnliche Titel

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Dokumentinformationen

Titel:

Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements

Beteiligte:

Tabuchi, M. (Autor:in) / Kyouzu, H. (Autor:in) / Takemi, M. (Autor:in) / Takeda, Y. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 216 ; 526-531

Erscheinungsdatum:

01.01.2003

Format / Umfang:

6 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 621.35

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