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Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements
Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements
Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements
Tabuchi, M. (author) / Kyouzu, H. (author) / Takemi, M. (author) / Takeda, Y. (author)
APPLIED SURFACE SCIENCE ; 216 ; 526-531
2003-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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