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Structural and Electronic Properties of a Thin Metal-Silicide Film on Silicon Surface: A First-Principles Study
Structural and Electronic Properties of a Thin Metal-Silicide Film on Silicon Surface: A First-Principles Study
Structural and Electronic Properties of a Thin Metal-Silicide Film on Silicon Surface: A First-Principles Study
Kang, B. S. (Autor:in) / Kang, H. J. (Autor:in) / Oh, S. K. (Autor:in)
SURFACE REVIEW AND LETTERS ; 10 ; 183-188
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
530.417
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