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Positron beam analysis of structurally ordered porosity in mesoporous silica thin films
Positron beam analysis of structurally ordered porosity in mesoporous silica thin films
Positron beam analysis of structurally ordered porosity in mesoporous silica thin films
van Veen, A. (Autor:in) / Escobar Galindo, R. (Autor:in) / Schut, H. (Autor:in) / Eijt, S. W. (Autor:in) / Falub, C. V. (Autor:in) / Balkenende, A. R. (Autor:in) / de Theije, F. K. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 2-7
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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