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A Quantitative Basis for Rocking Curve Measurement of Highly Oriented Polycrystalline Thin Films
A Quantitative Basis for Rocking Curve Measurement of Highly Oriented Polycrystalline Thin Films
A Quantitative Basis for Rocking Curve Measurement of Highly Oriented Polycrystalline Thin Films
Toraya, H. (Autor:in) / Hibino, H. (Autor:in) / Ida, T. (Autor:in)
MATERIALS SCIENCE FORUM ; 443/444 ; 145-150
01.01.2004
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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