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Defects in GaSb Studied by Coincidence Doppler Broadening Measurements
Defects in GaSb Studied by Coincidence Doppler Broadening Measurements
Defects in GaSb Studied by Coincidence Doppler Broadening Measurements
Hu, W. G. (Autor:in) / Wang, Z. (Autor:in) / Dai, Y. Q. (Autor:in) / Wang, S. J. (Autor:in) / Zhao, Y. W. (Autor:in)
MATERIALS SCIENCE FORUM ; 445/446 ; 114-116
01.01.2004
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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