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AFM Analysis of Quantum Dot Structures Induced by Ion Sputtering with Different Tips
AFM Analysis of Quantum Dot Structures Induced by Ion Sputtering with Different Tips
AFM Analysis of Quantum Dot Structures Induced by Ion Sputtering with Different Tips
Xu, M. (Autor:in) / Teichert, C. (Autor:in)
SURFACE REVIEW AND LETTERS ; 10 ; 837-842
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
530.417
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