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Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering
Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering
Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering
Frost, F. (Autor:in) / Hirsch, D. (Autor:in) / Schindler, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 179 ; 8-12
01.01.2001
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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