Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies
Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies
Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies
Karunagaran, B. (Autor:in) / Rajendra Kumar, R. T. (Autor:in) / Senthil Kumar, V. (Autor:in) / Mangalaraj, D. (Autor:in) / Narayandass, S. K. (Autor:in) / Mohan Rao, G. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 6 ; 547-550
01.01.2003
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Corrosion of thin, magnetron sputtered Nb2O5 films
| British Library Online Contents | 2016
Structural and optical properties investigation of DC magnetron sputtered b-TiO2 thin film
| British Library Online Contents | 2014
Corrosion of thin, magnetron sputtered Nb2O5 films
| British Library Online Contents | 2016
On the non-linear I-V characteristics of dc magnetron sputtered TiO2 thin films
| British Library Online Contents | 2003
Structural and optical studies on dc reactive magnetron sputtered Cu2O films
| British Library Online Contents | 2006