A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies
Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies
Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies
Karunagaran, B. (author) / Rajendra Kumar, R. T. (author) / Senthil Kumar, V. (author) / Mangalaraj, D. (author) / Narayandass, S. K. (author) / Mohan Rao, G. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 6 ; 547-550
2003-01-01
4 pages
Article (Journal)
English
DDC:
621.38152
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Structural and optical properties investigation of DC magnetron sputtered b-TiO2 thin film
| British Library Online Contents | 2014
Corrosion of thin, magnetron sputtered Nb2O5 films
| British Library Online Contents | 2016
Corrosion of thin, magnetron sputtered Nb2O5 films
| British Library Online Contents | 2016
On the non-linear I-V characteristics of dc magnetron sputtered TiO2 thin films
| British Library Online Contents | 2003
Microstructures of magnetron sputtered Fe-Au thin films
| British Library Online Contents | 2015