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Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation
Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation
Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation
Hijikata, Y. (Autor:in) / Yaguchi, H. (Autor:in) / Ishida, Y. (Autor:in) / Yoshikawa, M. (Autor:in) / Kamiya, T. (Autor:in) / Yoshida, S. (Autor:in)
MATERIALS SCIENCE FORUM ; 457/460 ; 1341-1344
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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