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    Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation

    New search for: Hijikata, Y.
    New search for: Yaguchi, H.
    New search for: Ishida, Y.
    New search for: Yoshikawa, M.
    New search for: Kamiya, T.
    New search for: Yoshida, S.

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    Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation

    New search for: Hijikata, Y.
    New search for: Yaguchi, H.
    New search for: Ishida, Y.
    New search for: Yoshikawa, M.
    New search for: Kamiya, T.
    New search for: Yoshida, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation

    New search for: Hijikata, Y.
    New search for: Yaguchi, H.
    New search for: Ishida, Y.
    New search for: Yoshikawa, M.
    New search for: Kamiya, T.
    New search for: Yoshida, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation

    Contributors:

    Hijikata, Y. (author) / Yaguchi, H. (author) / Ishida, Y. (author) / Yoshikawa, M. (author) / Kamiya, T. (author) / Yoshida, S. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 457/460 ; 1341-1344

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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