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Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images-looking beyond the obvious
Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images-looking beyond the obvious
Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images-looking beyond the obvious
Smentkowski, V. S. (Autor:in) / Ohlhausen, J. A. (Autor:in) / Kotula, P. G. (Autor:in) / Keenan, M. R. (Autor:in)
APPLIED SURFACE SCIENCE ; 231/232 ; 245-249
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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