Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
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Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysis
Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysis
Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysis
Reedy, R. C. (Autor:in) / Geisz, J. F. (Autor:in) / Ptak, A. J. (Autor:in) / Keyes, B. M. (Autor:in) / Metzger, W. K. (Autor:in)
APPLIED SURFACE SCIENCE ; 231/232 ; 808-812
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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