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Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysis

Reedy, R. C. / Geisz, J. F. / Ptak, A. J. / Keyes, B. M. / Metzger, W. K.

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Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysis

Reedy, R. C. / Geisz, J. F. / Ptak, A. J. / Keyes, B. M. / Metzger, W. K.

Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysis

Reedy, R. C. / Geisz, J. F. / Ptak, A. J. / Keyes, B. M. / Metzger, W. K.

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Title:

Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysis

Contributors:

Reedy, R. C. (author) / Geisz, J. F. (author) / Ptak, A. J. (author) / Keyes, B. M. (author) / Metzger, W. K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 231/232 ; 808-812

Publication date:

2004-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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