Analysis on nitrogen oxides by TOF-SIMS

Hashimoto, M. / Watanabe, E. / Amano, C. et al. | British Library Online Contents | 2008

SIMS quantification of low concentration of nitrogen doped in silicon crystals

Fujiyama, N. / Karen, A. / Sams, D. B. et al. | British Library Online Contents | 2003

SIMS analysis of nitrogen in various metals and ZnO

Li, Y. / Wang, S. / Smith, S. P. | British Library Online Contents | 2006

Quantitative SIMS analysis of nitrogen using in situ internal implantation

Seki, S. / Tamura, H. / Sumiya, H. | British Library Online Contents | 1999

Enhanced field emission from nitrogen-doped amorphous diamond

Kan, M.-C. / Huang, J.-L. / Sung, J. C. et al. | British Library Online Contents | 2003