Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Cluster ion emission from nitrogen-doped GaAs and optimization of SIMS conditions for nitrogen analysis

    New search for: Guryanov, G. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Cluster ion emission from nitrogen-doped GaAs and optimization of SIMS conditions for nitrogen analysis

    New search for: Guryanov, G. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Cluster ion emission from nitrogen-doped GaAs and optimization of SIMS conditions for nitrogen analysis

    New search for: Guryanov, G. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Cluster ion emission from nitrogen-doped GaAs and optimization of SIMS conditions for nitrogen analysis

    Contributors:

    Guryanov, G. M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 231/232 ; 817-820

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Analysis on nitrogen oxides by TOF-SIMS

    Hashimoto, M. / Watanabe, E. / Amano, C. et al. | British Library Online Contents | 2008

    SIMS quantification of low concentration of nitrogen doped in silicon crystals

    Fujiyama, N. / Karen, A. / Sams, D. B. et al. | British Library Online Contents | 2003

    SIMS analysis of nitrogen in various metals and ZnO

    Li, Y. / Wang, S. / Smith, S. P. | British Library Online Contents | 2006

    Quantitative SIMS analysis of nitrogen using in situ internal implantation

    Seki, S. / Tamura, H. / Sumiya, H. | British Library Online Contents | 1999

    Enhanced field emission from nitrogen-doped amorphous diamond

    Kan, M.-C. / Huang, J.-L. / Sung, J. C. et al. | British Library Online Contents | 2003

    Back to top