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Lattice distortion due to surface treatment of bias sputtering revealed by extremely asymmetric X-ray diffraction
Lattice distortion due to surface treatment of bias sputtering revealed by extremely asymmetric X-ray diffraction
Lattice distortion due to surface treatment of bias sputtering revealed by extremely asymmetric X-ray diffraction
Yoshida, Y. (Autor:in) / Akimoto, K. (Autor:in) / Emoto, T. (Autor:in) / Kikuchi, S. (Autor:in) / Itagaki, K. (Autor:in) / Namita, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 234 ; 409-414
01.01.2004
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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