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Lattice distortion due to surface treatment of bias sputtering revealed by extremely asymmetric X-ray diffraction
Lattice distortion due to surface treatment of bias sputtering revealed by extremely asymmetric X-ray diffraction
Lattice distortion due to surface treatment of bias sputtering revealed by extremely asymmetric X-ray diffraction
Yoshida, Y. (author) / Akimoto, K. (author) / Emoto, T. (author) / Kikuchi, S. (author) / Itagaki, K. (author) / Namita, H. (author)
APPLIED SURFACE SCIENCE ; 234 ; 409-414
2004-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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