Application of Scanning Laser Source Technique for Nondestructive Flaw Detection

Choi, S. W. (Autor:in) / Lee, J. H. (Autor:in) / Nam, A. J. (Autor:in) / Krishnaswamy, S. (Autor:in) / Lee, S.-S. / Yoon, D.-J. / Lee, J.-H. / Lee, S.

Advances in Nondestructive Evaluation Part 1 Proceedings of the 11^t^h Asian Pacific Conference on Nondestructive Testing, Jeju Island, Korea, 3-7 November 2003 ; 787-792

KEY ENGINEERING MATERIALS ; 270/273

01.01.2004

6 pages

1013-9826

Aufsatz (Zeitschrift)

Print

Englisch

DDC:  620.11