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Application of photon interference x-ray absorption fine structure (piXAFS) to amorphous systems
Application of photon interference x-ray absorption fine structure (piXAFS) to amorphous systems
Application of photon interference x-ray absorption fine structure (piXAFS) to amorphous systems
Kappen, P. (Autor:in) / Haack, N. (Autor:in) / Klementev, K. (Autor:in) / Materlik, G. (Autor:in) / Nishino, Y. (Autor:in)
PHYSICS AND CHEMISTRY OF GLASSES ; 43 ; 48-50
01.01.2004
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.144
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