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    Application of photon interference x-ray absorption fine structure (piXAFS) to amorphous systems

    New search for: Kappen, P.
    New search for: Haack, N.
    New search for: Klementev, K.
    New search for: Materlik, G.
    New search for: Nishino, Y.

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    Application of photon interference x-ray absorption fine structure (piXAFS) to amorphous systems

    New search for: Kappen, P.
    New search for: Haack, N.
    New search for: Klementev, K.
    New search for: Materlik, G.
    New search for: Nishino, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Application of photon interference x-ray absorption fine structure (piXAFS) to amorphous systems

    New search for: Kappen, P.
    New search for: Haack, N.
    New search for: Klementev, K.
    New search for: Materlik, G.
    New search for: Nishino, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Application of photon interference x-ray absorption fine structure (piXAFS) to amorphous systems

    Contributors:

    Kappen, P. (author) / Haack, N. (author) / Klementev, K. (author) / Materlik, G. (author) / Nishino, Y. (author)

    Published in:

    PHYSICS AND CHEMISTRY OF GLASSES ; 43 ; 48-50

    Publication date:

    2004-01-01

    Size:

    3 pages

    ISSN:

    0031-9090

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.144

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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