Characterization of nanometer-sized dendritic form structures fabricated on insulator substrates with an electron-beam-induced deposition in a TEM: Fid-Bau Portal

Characterization of nanometer-sized dendritic form structures fabricated on insulator substrates with an electron-beam-induced deposition in a TEM

Song, M. / Mitsuishi, K. / Takeguchi, M. / Furuya, K.

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Characterization of nanometer-sized dendritic form structures fabricated on insulator substrates with an electron-beam-induced deposition in a TEM

Song, M. / Mitsuishi, K. / Takeguchi, M. / Furuya, K.

Characterization of nanometer-sized dendritic form structures fabricated on insulator substrates with an electron-beam-induced deposition in a TEM

Song, M. / Mitsuishi, K. / Takeguchi, M. / Furuya, K.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Dokumentinformationen

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Titel:

Characterization of nanometer-sized dendritic form structures fabricated on insulator substrates with an electron-beam-induced deposition in a TEM

Beteiligte:

Song, M. (Autor:in) / Mitsuishi, K. (Autor:in) / Takeguchi, M. (Autor:in) / Furuya, K. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 241 ; 107-112

Erscheinungsdatum:

01.01.2005

Format / Umfang:

6 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 621.35

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