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Evolution of Stress-Induced Surface Damage and Stress-Relaxation of Electroplated Cu Films at Elevated Temperatures
Evolution of Stress-Induced Surface Damage and Stress-Relaxation of Electroplated Cu Films at Elevated Temperatures
Evolution of Stress-Induced Surface Damage and Stress-Relaxation of Electroplated Cu Films at Elevated Temperatures
Hwang, S. J. (Autor:in) / Koike, J. (Autor:in) / Joo, Y. C. (Autor:in)
MATERIALS SCIENCE FORUM ; 475/479 ; 3641-3646
01.01.2005
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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