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Defect Properties in GaN: Ab Initio and Empirical Potential Calculations
Defect Properties in GaN: Ab Initio and Empirical Potential Calculations
Defect Properties in GaN: Ab Initio and Empirical Potential Calculations
Gao, F. (Autor:in) / Bylaska, E. J. (Autor:in) / Weber, W. J. (Autor:in)
MATERIALS SCIENCE FORUM ; 475/479 ; 3087-3090
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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