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Defect Properties in GaN: Ab Initio and Empirical Potential Calculations

Gao, F. / Bylaska, E. J. / Weber, W. J.

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Defect Properties in GaN: Ab Initio and Empirical Potential Calculations

Gao, F. / Bylaska, E. J. / Weber, W. J.

Defect Properties in GaN: Ab Initio and Empirical Potential Calculations

Gao, F. / Bylaska, E. J. / Weber, W. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Defect Properties in GaN: Ab Initio and Empirical Potential Calculations

Contributors:

Gao, F. (author) / Bylaska, E. J. (author) / Weber, W. J. (author)

Published in:

MATERIALS SCIENCE FORUM ; 475/479 ; 3087-3090

Publication date:

2005-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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