Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications
X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications
X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications
Genzel, C. (Autor:in)
MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 21 ; 10-18
01.01.2005
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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