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X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications
X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications
X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications
Genzel, C. (author)
MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 21 ; 10-18
2005-01-01
9 pages
Article (Journal)
English
DDC:
620.11
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