Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Novel manipulation in environmental scanning electron microscope for measuring mechanical properties of single nanoparticles
Novel manipulation in environmental scanning electron microscope for measuring mechanical properties of single nanoparticles
Novel manipulation in environmental scanning electron microscope for measuring mechanical properties of single nanoparticles
Liu, T. (Autor:in) / Donald, A. M. (Autor:in) / Zhang, Z. (Autor:in)
MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 21 ; 289-294
01.01.2005
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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