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Characterization of elastic moduli of Cu thin films using nanoindentation technique
Characterization of elastic moduli of Cu thin films using nanoindentation technique
Characterization of elastic moduli of Cu thin films using nanoindentation technique
Hong, S. H. (Autor:in) / Kim, K. S. (Autor:in) / Kim, Y. M. (Autor:in) / Hahn, J. H. (Autor:in) / Lee, C. S. (Autor:in) / Park, J. H. (Autor:in)
COMPOSITES SCIENCE AND TECHNOLOGY ; 65 ; 1401-1408
01.01.2005
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.118
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