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In-situ transmission electron microscopy study of glissile grain boundary dislocation relaxation in a near =3{111} grain boundary in copper
In-situ transmission electron microscopy study of glissile grain boundary dislocation relaxation in a near =3{111} grain boundary in copper
In-situ transmission electron microscopy study of glissile grain boundary dislocation relaxation in a near =3{111} grain boundary in copper
Couzinie, J. P. (Autor:in) / Decamps, B. (Autor:in) / Boulanger, L. (Autor:in) / Priester, L. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 400-401 ; 264-267
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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